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Multi-busbar circular welding strips can increase the optical utilization rate from less than 5% to more than 40%.
The half-cell design results in the reduction of resistance loss, increase of cell gap, and eventually improvement of module power by more than 10w.
Low risks of hidden crack and busbar breaking
Multi-busbar design, with short collection carrier conduction distance; a lot of transmission channels for option, with little impact of hidden cracks on current transmission.
Improved utilization of incident light
Multi-busbar patching technology further improves the utilization of incident light.
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